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By A. Modinos
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Additional info for Field, Thermionic, and Secondary Electron Emission Spectroscopy
Example text
14) depends on F = fJV. Fortunately, this dependence is weak and an accurate solution for fJ may be obtained efficiently by an iterative process. Once the magnitude of fJ for a given plarte has been fixed in the above manner the values of fJ for other planes can be obtained from the experimental fJ(8)/fJo curve. More direct methods for measuring the local field at the emitter surface, under conditions appropriate to a field emission experiment, are not presently available. A method valid in the thermal-field region has been suggested by Bermond (1975).
2. We see that only in the case of the (tOO) plane are the results very different. This may be partly due to the non-free-electron character in the field emission energy distribution from this plane (see Fig. 1 have been calculated. An interesting feature of the tungsten results is the fact that for some planes the temperature coefficient of the work function is positive and for others negative, in contrast to the copper results, where this coefficient is negative for every plane. 1 but for every other Cu plane for which d 10. 3 o o ! 4 ~ e ... 7 e FIGURE 2. 10 Work function of different faces of tungsten. The circles denote values obtained from field emission measurements. The squares are experimental values obtained by other methods (thermionic emission, contact potential difference, photoelectric threshold, surface ionization). 16 A). The solid line is the result of a semiempirical theory (Modinos, 1978b). obtained by the other methods, with the exception of the (110) plane where fieldemission data analyzed on the basis of Eq.