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By Jaiswal, Ravi; Mittal, K. L
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Extra resources for Particle adhesion and removal
Sample text
When ‘measuring’ Hamaker constants, one may use the continuum approaches outlined above, which require evaluation of the dielectric responses of the interacting materials over a range of frequencies of incident radiation. If one wishes to measure the Hamaker constant directly, then one typically employs methods to measure the interaction force at conditions where van der Waals forces are the dominant forces. One then uses a van der Waals force model to describe the force and a value for the Hamaker constant is extracted.
When the van der Waals forces between the cantilever and the surface are strong enough, the cantilever “snaps” into contact. The cantilever is then pushed into the surface until it reaches a previously determined deflection or vertical displacement. Next, the cantilever is pulled away from the surface. The force required to pull the cantilever out of contact with the surface (the pull-off force) is taken as the adhesion force. , [128]). When relating AFM-measured forces to the Hamaker coefficient, it is often assumed that the surfaces are smooth and that the AFM cantilever tip is hemispherical [129].
In this case, where the surface is a theoretical, atomically flat surface and the cantilever tip is assumed to have perfect geometry and no roughness, the Kelvin-Laplace predictions are appropriate at lower RH levels than would be appropriate for realistic systems. The shapes of the simulated AFM probes are assumed to be (a) spherical, (b) polynomial with flat tip, (c) conical, (d) truncated conical, and (e) polynomial with curved tip. 13 (bottom), particle geometry has a strong impact on the capillary forces, emphasizing the importance of adequate modeling of the particle geometry for reliable prediction of these forces.